The LT-NEO is the fastest turret-style test handler from UENO SEIKI. Positioned as the company’s flagship "world’s fastest" model, its primary function is to perform high-speed visual inspection, electrical testing, and sorting/taping of ultra-miniature electronic components.
Key Selling Points: Extreme Speed and Damage-Free Handling of Ultra-Small Components
Its most notable specification is a throughput of up to 120,000 UPH (units per hour), making it the fastest system in UENO SEIKI’s product lineup. Furthermore, utilizing patented load-control technology, the machine can handle ultra-small chips—as tiny as 0.4 mm × 0.2 mm—without causing damage, ensuring the integrity of these minuscule components even at extreme operating speeds.
Compatible Components and Inspection Capabilities
The system utilizes a parts feeder for input and is primarily designed for leadless or small-sized components, such as diodes, inductors, LEDs, and capacitors, while also supporting leaded packages. It comes standard with six-sided visual inspection capabilities, allowing for comprehensive optical screening of components both before and after electrical testing.
Test Integration
The LT-NEO does not include an integrated test unit; instead, it is designed to work with customer-supplied test equipment. Through IGBT and TTL interfaces, it is compatible with testers from various manufacturers, offering flexibility for production lines to leverage existing testing resources.
Target Application
The LT-NEO is specifically tailored for scenarios where components are supplied in bulk or via a parts feeder, are extremely small (e.g., 0402 size), and require maximum throughput. For components supplied in tubes or on wafer frames, UENO SEIKI’s XD or RV series would be the appropriate alternatives. The core value of the LT-NEO lies in its turret-based architecture, which pushes the high-speed sorting of ultra-small components to the absolute limit of UENO SEIKI’s product portfolio.
