ACCRETECH TSK AltaProv

The ACCRETECH TSK AltaProv is a multi-station prober designed specifically for the high-volume production testing of 300mm NAND flash memory. Its core feature is an array of 12 independent test stations, each equipped with a dedicated XY stage and POGO tower, enabling the testing of an entire wafer in a single touch-down—a capability that significantly boosts test throughput. Optimized for high-stack architectures such as 3D NAND, the system offers high-precision positioning and ultra-low leakage current detection, making it ideally suited for large-scale production lines at memory chip manufacturers and OSAT (outsourced semiconductor assembly and test) providers.