ACCRETECH TSK AP3000

The ACCRETECH TSK AP3000 is a next-generation, ultra-high-performance, fully automatic prober designed for 300mm wafers. It excels in high precision, high throughput, and low-vibration, low-noise operation. With a positioning accuracy of ±1.5μm, it is well-suited for testing fine-pitch features and sensitive parameters. The system features optimized indexing and wafer alignment efficiency, supports dual-loader configurations or automated material handling system (AMHS) integration, and offers a variety of chuck options—including ambient, high-temperature, low-temperature, and low-noise versions. Additionally, it can be equipped with an automatic probe card changer (APC) and probe cleaning capabilities. The AP3000 is compatible with recipes and map data from previous generations, comes standard with anti-virus software, and is widely used for the high-volume production testing of logic, power, and MEMS wafers.