
The TSK UF200 is an 8-inch fully automatic wafer prober manufactured by Tokyo Seimitsu (ACCRETECH) of Japan, designed primarily for semiconductor wafer testing. It accommodates wafers ranging from 5 to 8 inches in diameter and utilizes an OTS (Optical Target System) for automatic alignment. The system offers an overall precision of approximately 2 microns, supports multi-site testing, and is capable of high-temperature testing up to 150°C. It is well-suited for the electrical characterization of integrated circuits, MEMS sensors, and power devices—both during the R&D phase and in mass production—and is recognized for its high precision and automated testing efficiency.