ACCRETECH TSK UF200R

The ACCRETECH TSK UF200R is a high-speed, fully automatic prober designed for 200mm wafers, primarily targeting the testing of discrete devices and general-purpose logic chips. It supports the handling and measurement of 5- to 8-inch wafers and utilizes the same MMI (Man-Machine Interface) as the UF2000 series, ensuring both high efficiency—with XY-axis movement speeds reaching up to 300mm/s—and operational consistency. The system offers excellent expandability, with optional modules available for applications such as temperature-controlled testing (from cryogenic to high temperatures), specialized MEMS wafer handling, processing of ultra-thin or warped wafers, and low-current or high-voltage testing, making it a flexible solution for both R&D and mass production environments.