Used chroma 3650

The Chroma 3650 is a System-Level Test (SLT) solution from Chroma ATE. Unlike the 3380 (a VLSI production tester) that you previously inquired about, the 3650 focuses on functional verification and production screening of chips within an environment that closely mimics real-world system conditions. It is designed for applications such as AI server CPUs/GPUs, automotive electronics, 5G communications, and high-performance computing (HPC) chips.

Core Architecture: It utilizes an open architecture and a modular design, allowing for the flexible integration of various commercial off-the-shelf instruments—such as power supplies, oscilloscopes, and signal generators—alongside customized test modules, rather than relying on a closed, proprietary pin-card system. This design enables the platform to adapt to the system-level test requirements of diverse chip types, rather than being locked into a single device category.

Key Capabilities: The system supports multi-site parallel testing and enhances production throughput through efficient test program management, data logging, and automated workflows. For AI and automotive chips, it can perform functional testing, protocol verification, and reliability screening. As an SLT solution, it evaluates chip behavior under simulated real-world operating scenarios, going beyond simple DC parameter checks or basic digital functional verification.

Application Scenarios: AI server and data center chips, automotive MCUs and SoCs, 5G base station and terminal chips, and edge computing devices. It complements the 3380 VLSI production tester: while the 3380 handles electrical parameter testing at the wafer or package level, the 3650 focuses on verifying device behavior at the board or system level.

In short, the 3650 is a platform through which Chroma leverages an open SLT architecture to enter the testing market for AI and automotive chips.