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越南语Metrology Inspection Equipment
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Used TBP CT1500 Inspection & Review System
The TBP CT1500 is a fully automated optical microscopic defect inspection and review system
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Used PROMETRIX RS50
The PROMETRIX RS50 is a non-contact sheet resistance and resistivity measurement system
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Used OLYMPUS MX50 High-Precision Optical Inspection Microscope
The OLYMPUS MX50 is a high-precision optical inspection microscope widely used in semiconductor front-end manufacturing and advanced packaging production lines
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NIKON OPTISTATION 150 for sale
The NIKON OPTISTATION 150 is a fully automated wafer defect review and metrology microscope system
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Used NANOMETRICS M6100
The NANOMETRICS M6100 is a fully automated optical thin-film thickness and quality measurement system
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Used NANOMETRICS AFT2100 Optical Constant Measurement System
The NANOMETRICS AFT2100 is a fully automated thin film thickness and optical constant measurement system.
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Used MACTRONIX AE1-568 Fully Automated Macroscopic Inspection System
The MACTRONIX AE1-568 is a fully automated macro inspection system
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Used KLA M&I Equipment TENCOR P2
The KLA-Tencor P2 is a classic fully automatic stylus profilometer from the Tencor product line (a KLA company).
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Used KE VR70 Optical Metrology System
The KE VR70 (by Kokusai Electric) is a high-precision optical metrology system designed for front-end semiconductor wafer manufacturing
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Used ECO 1000 FT-IR Infrared Spectroscopy Measurement System
The ECO 1000 FT-IR is a fully automated Fourier-Transform Infrared (FT-IR) spectroscopy system
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Used AGILENT M&I Equipment PTIC
Agilent's PTIC (usually referring to "Parameter Test Integrated Circuit" or the company's "Parameter Test System" platform) is a fully automated parameter tester.
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Used ADVANTEST M&I Equipment T6535
The Advantest T6535 is a fully automated wafer prober designed for 200mm (8-inch) wafers
