Used Chroma 3680 Advanced SoC Test System

The Chroma 3680 is an advanced SoC test system from Chroma ATE. Unlike the 3380 (a VLSI mass-production tester) or the 3650 (a system-level tester) that you previously inquired about, the 3680 is positioned as a high-parallelism mass-production test platform designed for MCUs, consumer SoCs, mixed-signal devices, and RF components. Its core value proposition lies in its flexible configuration and AI-assisted test program migration capabilities.

Key Specifications: The system features 24 interchangeable slots that support a mix of digital, analog, and mixed-signal modules. It offers up to 2,048 digital channels with a data rate of 1 Gbps, supports parallel testing for up to 2,048 sites, and provides an Edge Placement Accuracy (EPA) of ±150 ps. This level of parallelism is among the highest in its class, directly contributing to cost control in mass-production testing.

Core Functionality and Expansion: The system incorporates per-pin Timing Measurement Units (TMU/PPMU) and supports up to 64 scan chains. Analog and mixed-signal options include modules for data converter testing (HDADDA2), high-voltage/automotive applications (HDVI), video and audio mixed-signal testing (HDAVO), and high-current testing (HCDPS, capable of up to 32A per channel). RF testing is handled by the HDRF2 module, which supports protocols such as Bluetooth, Wi-Fi, and NB-IoT; when paired with up/down-converters, its range can extend into the 30 GHz millimeter-wave (mmWave) band.

Intelligent Features: At SEMICON Taiwan 2025, Chroma highlighted that the 3680 integrates AI-driven software capabilities, enabling real-time test program conversion. According to the company, this can reduce both the time required for program migration and the associated labor costs by over 80%—directly addressing the common pain point of complex program porting during production line changeovers.

In short, the 3680 is a flagship platform from Chroma, leveraging a strategy of "high parallelism, modular mixed-signal configuration, and AI-assisted migration" to target the mass-production testing of advanced SoCs and edge AI chips.