Used chroma Semiconductor Tester 3380

The Chroma 3380 is a VLSI integrated circuit test system from Chroma ATE. Unlike the Advantest memory-specific tester you previously inquired about, the Chroma 3380 is a general-purpose/mixed-signal test platform designed for the mass production testing of MCUs, logic ICs, power management ICs, LED driver ICs, and consumer-grade chips. Its primary selling points are high parallelism and cost-effectiveness.

Key specifications include a test frequency of 50/100 MHz, a data rate of 50/100 Mbps, and up to 1,280 digital I/O pins. It supports parallel testing for up to 1,024 sites—meaning 1,024 chips can be tested simultaneously—which directly impacts the cost of mass production testing. The system features a flexible architecture with interchangeable I/O, VI (voltage/current) source, and ADC/DAC modules, allowing for configuration tailored to specific testing requirements.

Applications: The system is designed for a wide range of devices, including MCUs, mixed-signal ICs (ADC/DAC), logic ICs, smart cards, CMOS image sensors (CIS), Class D power ICs, and Mini/Macro LED driver ICs. It has a significant installed base in the Chinese MCU testing market.

Series Positioning: The 3380 is the flagship model of the series, offering the highest channel count. Other models in the same family include the 3380P (512 channels) and 3380D (256 channels). All three share a compatible software interface, allowing users to select the appropriate model based on production capacity requirements or to scale up as needed.

In short, the Chroma 3380 is a general-purpose VLSI tester that leverages "high parallelism and a flexible architecture" to optimize the cost of mass production testing for mature-process and consumer-grade chips.