Advantest V93000 EXA Scale Digital Test Board – Pin Scale 5000

The Pin Scale 5000 is a high-density digital test module designed by Advantest for the V93000 EXA Scale test platform. It is primarily engineered to address the explosive growth in scan test data volumes for large-scale digital chips, such as those used in AI, high-performance computing (HPC), and mobile processors.

Core Specifications and Capabilities

The module provides 256 digital channels—doubling the density of the previous generation—which enables high-parallelism testing within a more compact system footprint, thereby reducing space and infrastructure costs for test facilities. It supports data rates of up to 5 Gbps and features the deepest vector memory available on the market at the time of its release, designed to execute highly efficient scan tests at maximum data rates.

Key Features

The module incorporates Advantest’s patented Xtreme Link technology, which facilitates high-speed data connectivity and real-time communication between modules, delivering industry-leading speeds for result processing. For advanced digital ICs that require extensive test vector coverage, the Pin Scale 5000 offers the necessary memory depth and throughput capacity.