Electroglas Horizon 4000 Series Automated Wafer Prober
Product Detail
The EG4000 is not a single model, but rather a collective designation for the Horizon 4000 series of automated wafer probers from Electroglas (EG), designed specifically for high-volume electrical testing of 200mm (8-inch) wafers. It stands as one of the most widely installed prober series in semiconductor production lines; the 4090µ+ model you previously inquired about is a specific, enhanced version within this series.
Series Composition and Positioning: The series includes models such as the Horizon 4060X, 4080X, 4085X, and the flagship 4090. It is positioned to meet the demands of high-volume semiconductor manufacturing, offering automated capabilities such as probe-to-pad alignment optimization, in-process inspection, and Optical Character Recognition (OCR). The flagship 4090 was introduced in 1996, later spawning enhanced variants like the 4090µ (featuring a Class 1 micro-environment) and the 4090µ+ (equipped with "MicroTouch" low-damage contact technology).
Software and Upgrades: The equipment runs on the EGCommander system software, which supports touchscreen programming and recipe management. It can also be configured with a temperature-controlled chuck to maintain specific temperatures during testing. Given the age of the platform, third-party "APEX" retrofit kits are available on the market; these upgrade the control system to Windows 10/11 and add support for the automated handling of wafers ranging from 75mm to 200mm, thereby extending the equipment's operational lifespan.
In short, the EG4000 represents the primary family of probers from Electroglas during the era of 200mm high-volume testing, while the 4090µ+ is a later, enhanced configuration within that same series.











